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Improving faulty interaction localization using logistic regression

  • Kinari Nishiura
  • , Eun Hye Choi
  • , Osamu Mizuno

研究成果

抄録

Combinatorial testing is a widely used technique to detect failures caused by interactions of system under test (SUT) parameters. Faulty interaction localization (FIL) is a problem to locate parameter-value combinations that trigger failures from combinatorial test cases and their testing results. FIL is important for debugging, but is expensive for large test suites and SUTs since the number of candidates of faulty interactions increases exponentially with the number of parameters and the size of interactions. To address this problem, this paper proposes a method employing logistic regression. The proposed FIL based on Regression coefficients Of loGistic regression analysis (called FROG) computes the suspiciousness of each parameter-value combination to be included in a faulty interaction from its corresponding regression coefficient. We evaluate the proposed method by applying FROG to combinatorial t-way test cases (2 ≤ t ≤ 4) for real application SUT models, e.g. TCAS, GCC, and Apache. Our experiment results show that FROG can effectively locate faulty interactions injected while efficiently reducing the number of candidates of potential faulty interactions to be checked.

本文言語English
ホスト出版物のタイトルProceedings - 2017 IEEE International Conference on Software Quality, Reliability and Security, QRS 2017
出版社Institute of Electrical and Electronics Engineers Inc.
ページ138-149
ページ数12
ISBN(電子版)9781538605929
DOI
出版ステータスPublished - 8月 11 2017
外部発表はい
イベント17th IEEE International Conference on Software Quality, Reliability and Security, QRS 2017 - Prague
継続期間: 7月 25 20177月 29 2017

出版物シリーズ

名前Proceedings - 2017 IEEE International Conference on Software Quality, Reliability and Security, QRS 2017

Conference

Conference17th IEEE International Conference on Software Quality, Reliability and Security, QRS 2017
国/地域Czech Republic
CityPrague
Period7/25/177/29/17

ASJC Scopus subject areas

  • ソフトウェア
  • 安全性、リスク、信頼性、品質管理

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