抄録
In situ monitoring of indentation cracking in dielectric ceramics was examined by introducing a semiconducting region in the surface of the ceramics. Titanium dioxide was employed as the dielectric ceramic. The monitoring sensitivity can be enhanced by controlling the thickness of the conducting layer.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 221-223 |
| ページ数 | 3 |
| ジャーナル | Journal of Materials Science Letters |
| 巻 | 19 |
| 号 | 3 |
| DOI | |
| 出版ステータス | Published - 2000 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 材料科学（全般）