@inbook{ef447fee449e4cfd88c58f27d7b35f9e,
title = "Magnetic Flux Leakage Testing for Defect Characterization",
abstract = "As a further study on the low-level magnetized magnetic flux leakage testing, numerical simulations and measurements were conducted to investigate the influence of liftoff variation, applicability of the approach to local thinning and material characterization. The results showed that by magnetizing a test object to a low strength level and acquiring the weak magnetic flux leakage signals by a highly sensitive magneto-impedance sensor, local thinning and the change of magnetic property can be detected.",
keywords = "Magnetic flux leakage testing, Magneto-Impedance sensor, back-side wall thinning, local thinning, magnetic characterization",
author = "Weiying Cheng and Yoshinori Kamiyama and Keiji Tsukada",
note = "Publisher Copyright: {\textcopyright} 2016 The authors and IOS Press. All rights reserved.",
year = "2016",
doi = "10.3233/978-1-61499-639-2-126",
language = "English",
series = "Studies in Applied Electromagnetics and Mechanics",
publisher = "IOS Press",
pages = "126--133",
editor = "Tetsuya Uchimoto and Hiroaki Kikuchi and Noritaka Yusa",
booktitle = "Electromagnetic Nondestructive Evaluation (XIX)",
}