TY - JOUR
T1 - Minimum test sets for locally exhaustive testing of combinational circuits with five outputs
AU - Yokohira, Tokumi
AU - Shimizu, Toshimi
AU - Michinishi, Hiroyuki
AU - Sugiyama, Yuji
AU - Okamoto, Takuji
PY - 1994
Y1 - 1994
N2 - In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.
AB - In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.
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M3 - Conference article
AN - SCOPUS:0028727436
SN - 1081-7735
SP - 280
EP - 285
JO - Proceedings of the Asian Test Symposium
JF - Proceedings of the Asian Test Symposium
T2 - Proceedings of the 3rd Asian Test Symposium
Y2 - 15 November 1994 through 17 November 1994
ER -