Multi-wavelength study of PPDs using an OPO tunable pulse laser microscope system

Koji Yoshimura, Isamu Nakamura

研究成果査読

2 被引用数 (Scopus)

抄録

We have developed a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using an optical parametric oscillator (OPO) laser system. The laser spot can be focused to ∼2μm diameter, small enough to measure pixel-by-pixel performance of PPDs (pixelated photon detectors). Using multi-wavelength laser light, we plan to probe PPDs at various depths, thanks to their different penetration lengths in the silicon layer. In this paper, details of the commissioning of the laser microscope system and pilot measurements on a PPD at several wavelengths will be presented.

本文言語English
ページ(範囲)197-201
ページ数5
ジャーナルNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
695
DOI
出版ステータスPublished - 12月 11 2012
外部発表はい

ASJC Scopus subject areas

  • 核物理学および高エネルギー物理学
  • 器械工学

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