Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test

Junji Sakamoto, Ryoma Hirata, Tadahiro Shibutani

研究成果査読

3 被引用数 (Scopus)

抄録

In this study, the potential failure modes of a small operational amplifier circuit board were investigated. The high accelerated limit test (HALT) was employed to identify the failure modes under multi-axial vibration and temperature loadings. Five stress tests, specifically, low and high temperature, vibration, thermal shock, and composite profiles were performed. An aluminum electrolytic capacitor was damaged under the low temperature process, whereas the capacitance of a ceramic capacitor decreased under the high temperature process. The vibration test revealed that mechanical fatigue occurs at the terminal leads of aluminum electrolytic capacitors. The HALT also revealed coupled effects between high and low temperature processes and vibration.

本文言語English
ページ(範囲)19-24
ページ数6
ジャーナルMicroelectronics Reliability
85
DOI
出版ステータスPublished - 6月 2018
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 原子分子物理学および光学
  • 安全性、リスク、信頼性、品質管理
  • 凝縮系物理学
  • 表面、皮膜および薄膜
  • 電子工学および電気工学

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