Study of PPDs with multi-wavelength laser microscope system

Koji Yoshimura, Isamu Nakamura



Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have been developing a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ∼ 2 μm, small enough to measure pixel-by-pixel performance of PPD. Based on the feedback from commissioning, we have made several improvements which are essential for further detailed studies of the PPD. In this report, we will report improvements of the laser microscope system and test measurements using the new system.

ジャーナルProceedings of Science
出版ステータスPublished - 12月 1 2012
イベント3rd International Workshop on New Photon-Detectors, PhotoDet 2012 - Orsay
継続期間: 6月 13 20126月 15 2012

ASJC Scopus subject areas

  • 一般


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