TY - JOUR
T1 - Study of PPDs with multi-wavelength laser microscope system
AU - Yoshimura, Koji
AU - Nakamura, Isamu
PY - 2012/12/1
Y1 - 2012/12/1
N2 - Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have been developing a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ∼ 2 μm, small enough to measure pixel-by-pixel performance of PPD. Based on the feedback from commissioning, we have made several improvements which are essential for further detailed studies of the PPD. In this report, we will report improvements of the laser microscope system and test measurements using the new system.
AB - Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have been developing a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ∼ 2 μm, small enough to measure pixel-by-pixel performance of PPD. Based on the feedback from commissioning, we have made several improvements which are essential for further detailed studies of the PPD. In this report, we will report improvements of the laser microscope system and test measurements using the new system.
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M3 - Conference article
AN - SCOPUS:84890283742
SN - 1824-8039
JO - Proceedings of Science
JF - Proceedings of Science
T2 - 3rd International Workshop on New Photon-Detectors, PhotoDet 2012
Y2 - 13 June 2012 through 15 June 2012
ER -