TY - JOUR
T1 - Transistor application of alkyl-substituted picene
AU - Okamoto, Hideki
AU - Hamao, Shino
AU - Goto, Hidenori
AU - Sakai, Yusuke
AU - Izumi, Masanari
AU - Gohda, Shin
AU - Kubozono, Yoshihiro
AU - Eguchi, Ritsuko
N1 - Funding Information:
The authors greatly appreciate Ms. Saki Nishiyama for her kind assistance for FET measurements. This study is partly supported by Grants-in-aid (23684028, 22244045, 24654105, 24550054) from MEXT, by the Program to Disseminate the Tenure Tracking System of the Japan Science and Technology Agency (JST), by the LEMSUPER Project (JSTEU Superconductor Project) and the ACT-C Project of the JST, and by the Program for Promoting the Enhancement of Research Universities.
PY - 2014/5/23
Y1 - 2014/5/23
N2 - Field-effect transistors (FETs) were fabricated with a thin film of 3,10-ditetradecylpicene, picene-(C 14 H 29) 2, formed using either a thermal deposition or a deposition from solution (solution process). All FETs showed p-channel normally-off characteristics. The field-effect mobility,1/4, in a picene-(C 14 H 29) 2 thin-film FET with PbZr 0.52 Ti 0.48 O 3 (PZT) gate dielectric reached ∼21¢ €...cm 2 V ¢ ̂'1 s ¢ ̂'1, which is the highest1/4 value recorded for organic thin-film FETs; the average1/4 value (< 1/4>) evaluated from twelve FET devices was 14(4)¢ €...cm 2 V ¢ ̂'1 s ¢ ̂'1. The < 1/4> values for picene-(C 14 H 29) 2 thin-film FETs with other gate dielectrics such as SiO 2, Ta 2 O 5, ZrO 2 and HfO 2 were greater than 5¢ €...cm 2 V ¢ ̂'1 s ¢ ̂'1, and the lowest absolute threshold voltage, |V th |, (5.2¢ €...V) was recorded with a PZT gate dielectric; the average |V th | for PZT gate dielectric is 7(1)¢ €...V. The solution-processed picene-(C 14 H 29) 2 FET was also fabricated with an SiO 2 gate dielectric, yielding1/4 = 3.4 × 10 ¢ ̂'2 ¢ €...cm 2 V ¢ ̂'1 s ¢ ̂'1. These results verify the effectiveness of picene-(C 14 H 29) 2 for electronics applications.
AB - Field-effect transistors (FETs) were fabricated with a thin film of 3,10-ditetradecylpicene, picene-(C 14 H 29) 2, formed using either a thermal deposition or a deposition from solution (solution process). All FETs showed p-channel normally-off characteristics. The field-effect mobility,1/4, in a picene-(C 14 H 29) 2 thin-film FET with PbZr 0.52 Ti 0.48 O 3 (PZT) gate dielectric reached ∼21¢ €...cm 2 V ¢ ̂'1 s ¢ ̂'1, which is the highest1/4 value recorded for organic thin-film FETs; the average1/4 value (< 1/4>) evaluated from twelve FET devices was 14(4)¢ €...cm 2 V ¢ ̂'1 s ¢ ̂'1. The < 1/4> values for picene-(C 14 H 29) 2 thin-film FETs with other gate dielectrics such as SiO 2, Ta 2 O 5, ZrO 2 and HfO 2 were greater than 5¢ €...cm 2 V ¢ ̂'1 s ¢ ̂'1, and the lowest absolute threshold voltage, |V th |, (5.2¢ €...V) was recorded with a PZT gate dielectric; the average |V th | for PZT gate dielectric is 7(1)¢ €...V. The solution-processed picene-(C 14 H 29) 2 FET was also fabricated with an SiO 2 gate dielectric, yielding1/4 = 3.4 × 10 ¢ ̂'2 ¢ €...cm 2 V ¢ ̂'1 s ¢ ̂'1. These results verify the effectiveness of picene-(C 14 H 29) 2 for electronics applications.
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U2 - 10.1038/srep05048
DO - 10.1038/srep05048
M3 - Article
AN - SCOPUS:84901411878
SN - 2045-2322
VL - 4
JO - Scientific Reports
JF - Scientific Reports
M1 - 5048
ER -